Open AccessMeasuring and modeling the spectral bidirectional reflection distribution function of space target’s surface material
Author(s) -
Yan Yuan,
Chengming Sun,
Xiubao Zhang
Publication year - 2010
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.2097
Subject(s) - bidirectional reflectance distribution function , specular reflection , optics , scattering , reflection (computer programming) , observational error , remote sensing , computer science , physics , reflectivity , mathematics , geology , statistics , programming language
An absolute measuring principle and method of bidirectional reflection distribution function BRDF is presented. A spectral radiation meter with 3 nm spectral resolution and a three-dimensional rotating system with 001° accuracy are utilized to establish the automatic measuring platform. The spectral BRDF of typical space target’s surface materials yellow and silver tinfoil is measured in the range of 400—2500 nm. Measured results show that the scattering anglewhich corresponds to the maximum value of BRDF curveis generally in the specular reflection directionthe other BRDF values change slowly as scattering angle variesdeclining from middle to both sides and approximately following the cosine distribution. A BRDF error analysis method is introduced by using the RMS error calculationwhich provides a new way for the BRDF measurement system evaluation. The measurement error is 495%. With five-parameter model of BRDF and the simulated annealing SA algorithmthe optimum parameters of the model at each wavelength in the measured spectrum are retrieved at intervals of 1 nm. A comparison of the data calculated by the parametric model with the data measured originally verifies the feasibility and reliability of the modeling. The measuring and modeling results can provide reference data for space target detection and identification.