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In-plane and out-of-plane orientation influence on thermal stabilities of RBa2Cu3Oz thin film
Author(s) -
Xu Xue-Qin,
Chengying Tang,
Xuan Wang,
Cheng Ling,
Xin Yao
Publication year - 2010
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.1294
Subject(s) - materials science , microstructure , thin film , scanning electron microscope , thermal stability , diffraction , composite material , grain size , plane (geometry) , optical microscope , thermal , optics , nanotechnology , thermodynamics , chemical engineering , geometry , physics , mathematics , engineering
Appling high temperature optical microscopy HTOM, the in-situ observations on the melting process of RBa2Cu3OzRBCO oxide thin films were carried out. Combined the X-ray diffraction XRD pole figures with the scanning electron microscope SEM, the microstructure of RBCO thin films with different in-plane and out-of-plane orientations were studied. The relationship between the thermal stability of RBCO thin film and its microstructure was investigated. The conclusions of semi-coherent interface energy theory is in good agreement with the experimental results from HTOM, SEM and XRD. It is evident that the thermal stability of 0° in-plane YBCO grain surpasses the 45° one in the air. Additionally, it was found that a very small volume percentage of a-axis grain has an obvious influence on the decomposition behavior and thermal stability of SmBCO film.

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