Open AccessPore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy
Author(s) -
Wang Qiao-Zhan,
Rici Yu,
Xiubo Qin,
Yuxiao Li,
Baoyi Wang,
Quanjie Jia
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.8478
Subject(s) - materials science , mesoporous material , positron annihilation spectroscopy , mesoporous silica , spectroscopy , positron , positron annihilation , porosity , thin film , spin coating , annihilation radiation , isotropy , synchrotron radiation , nanotechnology , optics , composite material , physics , nuclear physics , chemistry , biochemistry , quantum mechanics , electron , catalysis
Mesoporous silica thin films with different pore shapes were prepared by evaporation induced self-assembly method. The synchrotron radiation x-ray reflectivity and slow positron annihilation techniques were used to characterize the pore structures. The results indicated that with increase of the spin-coating speed, the pore structure transformed from 3-D cubic to 2-D hexagonal, the average porosity also decreased. The correlation of the film structures and positron annihilation parameters was songht for with FT-IR spectroscopy and isotropic inorganic pore contraction model.