Open AccessInvestigation of atom-optical properties of laser focused Cr atomic deposition
Author(s) -
LU Xiang-dong,
Tongbao Li,
Yan Ma,
Lidong Wang
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.8205
Subject(s) - atom (system on chip) , wavelength , laser , deposition (geology) , materials science , atomic layer deposition , grating , semiclassical physics , atomic physics , field (mathematics) , optics , physics , layer (electronics) , nanotechnology , quantum mechanics , paleontology , mathematics , sediment , computer science , pure mathematics , quantum , biology , embedded system
Gating structure of one dimensional Cr layer is experimentally obtained through the technology of laser focused atomic deposition. The periodicity of grating is 212.8±0.2 nm measured by atomic force microscope, which is just equal to half of the wavelength of laser standing-wave field. Then, based on the semiclassical model and numerical calculation of the Adams-Bashforth-Moulton algorithm, both Cr atom motion trajectories are simulated and the atom-optical properties are analyzed at the same experimental conditions. The results show that the analytical results agree well with the experimental results.