Open AccessMagnetic properties of ultrathin (4?)Fe film studied by polarized neutron reflectometry
Author(s) -
Li Tian-Fu,
Dongfeng Chen,
Hongli Wang,
Sun Kai,
Yuntao Liu
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.7993
Subject(s) - neutron reflectometry , materials science , reflectometry , curie temperature , neutron , thin film , molecular beam epitaxy , magnetic moment , layer (electronics) , surface finish , analytical chemistry (journal) , optics , condensed matter physics , epitaxy , ferromagnetism , neutron scattering , nanotechnology , composite material , small angle neutron scattering , chemistry , time domain , physics , quantum mechanics , computer science , computer vision , chromatography
Ultrathin Fe film 200 V/4 Fe/900 V/MgO100 has been prepared by molecular beam epitaxy MBE. The structure parameters, such as the surface and interface roughness and the thickness of each layer, were obtained by X-ray and neutron reflectivity measurement. The magnetic properties of the thin Fe layer were investigated by polarized neutron reflectometry at different temperature. The result shows that the magnetic moment of an Fe atom is about 1.0±0.1 μB at room temperature and increases to 1.5±0.1 μB at 10 K. The Curie temperature of the thin Fe film is estimated to be 310±30K.