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Dynamic characteristics of Tl-2212 bicrystal Josephson junctions on SrTiO3 substrates and the effect of noise on it
Author(s) -
Zheng Wang,
Yue Hong-Wei,
Tiege Zhou,
Xinjie Zhao,
He Ming,
Xie Qing-lian,
Lan Fang,
Yan Shao-lin
Publication year - 2009
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.7216
Subject(s) - josephson effect , microwave , condensed matter physics , noise (video) , pi josephson junction , materials science , physics , high temperature superconductivity , superconductivity , optoelectronics , quantum mechanics , computer science , artificial intelligence , image (mathematics)
Tl-2212 bicrystal Josephson junctions on SrTiO3 substrates have been fabricated. The I-V characteristic of a Josephson junction under microwave radiation were measuredand microwave induced steps were observed in accordance with the Josephson frequency-voltage relationship. The RCSJ model including noise of bicrystal Josephson junction was constructed through numerical simulationand the results of simulation were in good agreement with the experimental data. Using the RCSJ modelwe investigated the effect of noise on the dynamic characteristics of Josephson junction through simulationand explained the phenomenon of reduced height and increased breadth of the minima of microwave induced steps. We proposed that the effective noise temperature should be the sum of operational temperature and equivalent temperature of the external noise.

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