Open AccessResearch on the surface scattering properties of optical films by the total integrated scatter
Author(s) -
Haijun Hou,
Xu Sun,
Guocai Tian,
Wu Shi-Gang,
Xiaofeng Ma,
Jianda Shao,
Zhengxiu Fan
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.6425
Subject(s) - materials science , scattering , wavelength , optics , surface roughness , root mean square , surface finish , reflection (computer programming) , surface (topology) , light scattering , optoelectronics , composite material , physics , mathematics , computer science , geometry , quantum mechanics , programming language
The root mean square RMS roughness and surface scattering of Ag filmsY2O3-stabilized ZrO2 filmsTiO2 filmsand 1064 nm & 532 nm two-wavelength-reflection-reducing films are studied respectively by the total integrated scatter. Considering the preparation conditiongrowth processmaterial compositionand optical characteristics of the samplesthe above measurement results are explained reasonably.