Open AccessThird-order nonlinear optical properties of CuO film
Author(s) -
Aiping Chen,
Hua Long,
Kai Wang,
Guang Yang,
Fu Ming,
Yuhua Li,
Peixiang Lu
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.607
Subject(s) - materials science , thin film , femtosecond , raman spectroscopy , scanning electron microscope , z scan technique , transmittance , optics , ultrashort pulse , spectroscopy , laser , fused quartz , optoelectronics , nonlinear optics , analytical chemistry (journal) , quartz , nanotechnology , physics , chemistry , chromatography , quantum mechanics , composite material
Single-phase CuO thin films have been obtained on Si(100) and quartz substrates using pulsed laser deposition technique. The structure, surface image, optical transmittance and reflectance of the films were characterized by X-ray diffraction, Raman spectroscopy, scanning electron microscopy and UV-vis spectroscopy. The SEM image demonstrates that the grain size is about 45nm. The third-order optical nonlinearities in CuO films were investigated by Z-scan method using a femtosecond laser (800nm, 50fs). The results show that CuO films have ultrafast nonlinear optical response and large optical nonlinearity with the real and imaginary parts of third-order nonlinear susceptibility, χ(3), being -7.88×10-11 esu and -2.13×10-11 esu, respectively, indicating CuO thin films are potential materials for applications in nonlinear optical devices.