Open AccessUltrafast dynamics of thin-film aluminum observed by ultrafast electron diffraction
Author(s) -
Wenxi Liang,
Ping Zhu,
Xuan Wang,
Shouping Nie,
Zhang Zhong-Chao,
Jianming Cao,
Zheng-Ming Sheng,
Jie Zhang
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.5546
Subject(s) - ultrafast electron diffraction , femtosecond , ultrashort pulse , picosecond , materials science , diffraction , temporal resolution , excitation , laser , excited state , optics , electron diffraction , phonon , electron , oscillation (cell signaling) , optoelectronics , thin film , atomic physics , condensed matter physics , physics , nanotechnology , chemistry , biochemistry , quantum mechanics
Ultrafast electron diffraction UED is a powerful technique for the measurement of transient structures. Employing our UED system, with its capability of detecting a sub-milli-ngstrom lattice spacing change with a sub-picosecond temporal resolution, we performed the real-time observation of both the coherent phonon and thermal lattice motions of polycrystalline 20 nm Al film, which was excited by femtosecond laser pulses. The obtained coherent oscillation period of 7.4 ps and temperature rise of 77 K agree well with those from theoretical calculation. This achievement offers great promise to conduct measurements of transient structures with atomic spatiotemporal resolution in many dynamical processes that can be initiated by ultrafast optical excitation.