Open AccessA novel method to estimate the parameters of 1/f noise of semiconductor laser diodes
Author(s) -
Zhenguo Zhang,
Fengli Gao,
Guo Shu-Xu,
Xueyan Li,
Yu Shen
Publication year - 2009
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.58.2772
Subject(s) - wavelet , noise (video) , diode , white noise , signal (programming language) , materials science , semiconductor , transformation (genetics) , optics , laser , semiconductor laser theory , optoelectronics , physics , mathematics , statistics , computer science , image (mathematics) , gene , programming language , biochemistry , chemistry , artificial intelligence
The variable relation of the coefficient variance of wavelet transformation of 1/f fractal signal in white noise versus the scale is adequnately modified to develop a novel method based on least\|squares to estimate the parameters of 1/f noise of semiconductor laser diodes LDs. The measured data indicate that this method can effectively extract the 1/f noise submerged in white noise of LDs, and the estimated 1/f signal is in better accordance with the measured results of the contrast apparatus.