Open AccessThe effect of thickness on the structure and superconductivity of La1.85Sr0.15CuO4 films
Author(s) -
Mian Zu,
Yao-Zhong Zhang,
HH Wen
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.7257
Subject(s) - materials science , full width at half maximum , superconductivity , diffraction , sputter deposition , superconducting transition temperature , sputtering , condensed matter physics , thin film , transition temperature , optics , optoelectronics , nanotechnology , physics
Highly c-oriented La1.85Sr0.15CuO4 (LSCO) films were successfully deposited on SrTiO3 (STO) substrates by on-axis magnetron sputtering. By using the standard four-probe technique and X-ray diffraction (XRD), we investigated the influence of film thickness on the structure and superconductivity of LSCO(x=0.15) films. The experiment results show that the full-width at half maximum (FWHM) of the (006) rocking curve decreases with increasing film thickness, which indicates that the crystal qualities of films are improved. Meanwhile, the superconducting transition temperature is higher for the thicker films.