Open AccessEffect of annealing and Mg content on the microstructure and optical properties of Zn1-xMgxO films
Author(s) -
Zhou Jun,
QingQing Fang,
Baoming Wang,
Yanmei Liu,
Li Mao,
Yan Fang-Liang,
Shengnan Wang
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.6614
Subject(s) - wurtzite crystal structure , materials science , annealing (glass) , photoluminescence , impurity , thin film , analytical chemistry (journal) , doping , band gap , diffraction , ultraviolet , microstructure , grain size , optics , optoelectronics , nanotechnology , composite material , chemistry , metallurgy , zinc , physics , organic chemistry , chromatography
The MgxZn1-xO(x=0.1,0.2,0.3, 0.4,0.5,0.6 and 0.7)thin films were prepared on glass substrate by the Sol-Gel method. The X-ray diffraction results show that when the value of x is between 0.1 and 0.3, the thin film has the structure of hexagonal wurtzite while the angle of diffraction peak becomes bigger with increasing x, and the MgO impurity phase segregates at x=0.4. The ultraviolet photoluminescence spectra of the films show ultraviolet emission peak at room temperature, which has an increasing blue shift with the increasing content of Mg. The band gap of ZnO broadens with Mg-doping concentration increasing from 0.1 to 0.3. For the sample with x=0.1 annealed at 500℃, the crystal quality of the films is improved with the increase of the rate of temperature rise from 4.5℃/min to 6.0℃/min. For the sample with x=0.2, the crystal quality of the films is improved with the increase in annealing temperature from 500℃ to 560℃. With the annealing temperature increasing above 590 ℃ the crystal quality of the films degenerates.