Open AccessFerroelectric and optical properties of Pb(ZrxTi1-x)O3 bilayers
Author(s) -
Zhao Xiao-Ying,
Shijian Liu,
Chu Jun-Hao,
Ning Dai,
Hu Gu-Jin
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.5968
Subject(s) - materials science , ferroelectricity , bilayer , polarization (electrochemistry) , coercivity , prism , refractive index , perovskite (structure) , substrate (aquarium) , electric field , optics , condensed matter physics , dielectric , optoelectronics , chemical engineering , membrane , chemistry , physics , oceanography , engineering , quantum mechanics , biology , geology , genetics
The uniform, dense, and crack-free PbZr0.4Ti0.6O3/PbZr0.5Ti0.5O3 bilayer with (100)-preferred crystal orientation and a single perovskite phase was fabricated on LaNiO3-coated Si substrate by using chemical solution deposition. The bilayer exhibits excellent ferroelectric properties, remnant polarization of 64μC/cm2 and coercive field of 43.6kV/cm. The prism-film coupling measurement indicates that four transverse electric modes can be excited in the system of Si/LaNiO3/PbZr0.5Ti0.5O3/PbZr0.4Ti0.6O3 and the light can be effectively confined to propagate in the guiding-layer. The refractive index and thickness for each film were obtained by solving the mode eigen-equation of the waveguide.