
Structural and magnetic properties of Ni1-xFex O thin films synthesized by pulsed laser deposition
Author(s) -
Wei Weng,
Yan Wen-Sheng,
Zheng Sun,
Takeshi Yao,
Guo Yu-Xian,
Wenlin Feng,
Wei Shi-Qiang,
Guobin Zhang,
Ping Xu
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.5788
Subject(s) - materials science , pulsed laser deposition , ferromagnetism , x ray photoelectron spectroscopy , xanes , thin film , magnetic semiconductor , analytical chemistry (journal) , impurity , non blocking i/o , diffraction , doping , deposition (geology) , absorption edge , ferromagnetic material properties , spectroscopy , nuclear magnetic resonance , condensed matter physics , optics , optoelectronics , magnetization , nanotechnology , band gap , magnetic field , chemistry , paleontology , physics , sediment , biology , biochemistry , chromatography , quantum mechanics , catalysis , organic chemistry
Pulsed laser deposition (PLD) method was used to fabricate Ni1-xFexO (x=0.020.05) dilute magnetic semiconductor thin films with room temperature ferromagnetism. For the Ni0.98Fe0.03O sample with a lower Fe contentthe crystalline structures of the Ni1-xFexO films are of the NaCl type as determined by X-ray diffraction. For the Ni0.95Fe0.05O sample with a higher Fe contentsome additional weak diffraction peaks corresponding to α-Fe2O3 phase can be observed. From the X-ray absorption near edge structure (XANES) and X-ray photoelectron spectroscopy (XPS) it is shown that the doped Fe impurities in Ni0.98Fe0.02O are substitutionally incorporated into the NiO host and no secondary phases with room temperature ferromagnetism are found. These results show the intrinsic ferromagnetism of the Ni1-xFexO samples.