Open AccessHydrogen-induced changes in optical and electrical properties of LaMg2Ni alloy film
Author(s) -
Fang Fang,
Shiyou Zheng,
Guangyou Zhou,
Guorong Chen,
Sun Da-lin
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.3813
Subject(s) - materials science , alloy , annealing (glass) , thin film , transmission electron microscopy , hydrogen , scanning electron microscope , dehydrogenation , electrical resistivity and conductivity , metal , analytical chemistry (journal) , optics , composite material , metallurgy , nanotechnology , catalysis , biochemistry , chemistry , organic chemistry , chromatography , physics , engineering , electrical engineering
A 375nm thick LaMg2Ni alloy thin film was prepared by electron beam evaporation using LaNi, Mg and Ni targets, and followed by vacuum annealing at 350℃. Upon hydrogen loading/unloading, the reversible conversion from a metallic, reflecting state to a semiconducting, color-neutral transparent state was observed in the as-prepared film. The contrast ratios in both the transmission (400—900nm) and the resistivity between the reflecting state and the transparent state are over four orders of magnitude. The surface and the cross-section of the alloy films before and after hydrogenation were observed by scanning electron microscope and atomic force microscope, which showed that the lower reflection observed in the dehydrogenated film is due to the rough surface originating from the first hydrogenation.