Open AccessDependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer
Author(s) -
Meiya Li,
Jing Wang,
Jun Liu,
Bo Yu,
Dongyun Guo,
Zhao Xingzhong
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.3132
Subject(s) - materials science , scanning electron microscope , epitaxy , layer (electronics) , substrate (aquarium) , yttria stabilized zirconia , raman spectroscopy , pole figure , pulsed laser deposition , thin film , cubic zirconia , diffraction , composite material , analytical chemistry (journal) , optics , nanotechnology , ceramic , chemistry , oceanography , physics , chromatography , geology
Biaxially textured MgO templates were grown on un-textured metal substrates by inclined-substrate-deposition and YBa2Cu3O7-x films were epitaxially grown on these substrates by pulsed laser deposition. Yttria-stablized-zirconia and CeO2 were deposited in turn as buffer layers prior to YBa2Cu3O7-x growth. The biaxial alignment features of the films were examined by X-ray diffraction 2θ-scanpole-figure-scan and rocking curve of Ω angles. The Raman spectroscopyscanning electron microscopy and atomic force microscopy were used to characterize the orientation ordermorphology and surface roughness of the YBa2Cu3O7-x filmsrespectively. The influence of the thickness of CeO2 on the properties of the YBa2Cu3O7-x films were investigated and the singnificant and unique dependence of the properties of YBa2Cu3O7-x films on the thickness of CeO2 were revealed. The possible mechanisms for this dependence were discussed.