Open AccessThe coulomb potential energy effect on the intensity of the characteristic lines at highly charged ion incendence on Al surface
Author(s) -
Wang Li,
Xiaoan Zhang,
Zhenhua Yang,
Ximeng Chen,
Hongqiang Zhang,
Ying Chen,
Shao Jian-Xiong,
Xu Xu
Publication year - 2008
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.57.137
Subject(s) - atomic physics , ion , excited state , highly charged ion , kinetic energy , excitation , coulomb , intensity (physics) , coulomb explosion , spectral line , atom (system on chip) , physics , materials science , electron , ionization , ion source , optics , quantum mechanics , astronomy , computer science , embedded system
The Al atomic characteristic spectral lines were induced by the impact of 40Arq+ ions (8≤q≤16; kinetic energy 150keV) on Al surface. The result shows that by Penning impinging and resonant capture, the ion energy is deposited on the Al surface to excite the target atom, which is different from light excitation. Not only are the transitions betweem electronic configurations of the atomic complex excited, but the enhancing tendency of the characteristic spectral line intensity is consistent with the enhancing tendency of the coulomb potential energy of the incident ions with increasing charged states.