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The influence of distribution of Na+-dopant on the structure and dielectric properties of Ba0.25Sr0.75TiO3 thin film
Author(s) -
Qing Zhou,
Jiwei Zhai,
Xi Yao
Publication year - 2007
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.56.6666
Subject(s) - materials science , dielectric , microstructure , doping , thin film , dopant , dielectric loss , analytical chemistry (journal) , porosity , leakage (economics) , sol gel , composite material , nanotechnology , optoelectronics , chemistry , chromatography , economics , macroeconomics
Na+-doped and compositional graded doped Ba0.25Sr0.75TiO3 thin films were grown on Pt/Ti/SiO2/Si substrates by Sol-Gel technique. The dielectric properties of thin films were investigated as a function of Na+ doping level. It is revealed that with the increase of Na+ concentrations both the dielectric constant and the loss decrease continuously while the leakage current initially decreases (Na+< 2.5mol%) and then increases. The increase of leakage current may be caused by the formation of porous structure which was confirmed by field emission scanning microscopy (FE-SEM). The improvement of overall dielectric properties were achieved by using the compositional graded doping which results in a better microstructure in the film.

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