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Analysis of laser intensification by nodular defects in mid-infrared high reflectance coatings
Author(s) -
Ying Wang,
Yueguang Zhang,
Long Xu,
Chen Wei-Lan,
Yiyu Li
Publication year - 2007
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.56.6588
Subject(s) - materials science , reflectivity , infrared , laser , optics , optoelectronics , remote sensing , physics , geology
Electric field modeling of nodular defects is performed to investigate the interaction between defective multilayer coatings and Gaussian profile laser beam. Light intensity is significantly enhanced as large as 6 times within the nodular defects. Different geometries of defects irradiated by laser beams at 0 to 40 deg incident laser angles are analyzed. Nodules with large but shallow seeds, or irradiation of 40 deg p-polarized laser beam, tends to produce the greatest enhancement effect.

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