Analysis of laser intensification by nodular defects in mid-infrared high reflectance coatings | Zendy

Ying Wang | Zendy; Yueguang Zhang | Zendy; Xu Liu | Zendy; Chen Wei-Lan | Zendy; Yiyu Li | Zendy

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Analysis of laser intensification by nodular defects in mid-infrared high reflectance coatings

Author(s) -

Ying Wang,

Yueguang Zhang,

Xu Liu,

Chen Wei-Lan,

Yiyu Li

Publication year - 2007

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.56.6588

Subject(s) - materials science , reflectivity , infrared , laser , optics , optoelectronics , remote sensing , physics , geology

Electric field modeling of nodular defects is performed to investigate the interaction between defective multilayer coatings and Gaussian profile laser beam. Light intensity is significantly enhanced as large as 6 times within the nodular defects. Different geometries of defects irradiated by laser beams at 0 to 40 deg incident laser angles are analyzed. Nodules with large but shallow seeds, or irradiation of 40 deg p-polarized laser beam, tends to produce the greatest enhancement effect.

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