Structural and photoluminescence properties for SnO2:Sb films prepared on Al2O3 substrate
Author(s) -
Feng Xianjin,
Jin Ma,
Ge Song-Hua,
Ji Feng,
Yongli Wang,
Fan Yang,
Honglei Ma
Publication year - 2007
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.56.4872
Subject(s) - photoluminescence , materials science , crystallite , sapphire , rutile , luminescence , substrate (aquarium) , sputter deposition , optoelectronics , ultraviolet , sputtering , analytical chemistry (journal) , thin film , chemical engineering , optics , nanotechnology , laser , metallurgy , chemistry , oceanography , geology , engineering , physics , chromatography
The SnO2:Sb films have been prepared on sapphire (0001) substrates by radio frequency magnetron sputtering method. The structural and photoluminescence (PL) properties of the films were investigated. The prepared samples are polycrystalline films with rutile structure of pure SnO2. The photoluminescence of the samples was measured at room temperature. An ultraviolet luminescence peak near 334 nm was observed for the first time and the corresponding PL mechanism was investigated.
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