Open AccessMeasurement of carrier-envelope phase of few cycles Ti:sapphire laser by difference frequency technique
Author(s) -
Hainian Han,
Zhao Yan-Ying,
Wei Zhang,
Jiangfeng Zhu,
Peng Wang,
Zhiyi Wei,
Shiqun Li
Publication year - 2007
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.56.2756
Subject(s) - femtosecond , laser , materials science , frequency comb , optics , sapphire , ti:sapphire laser , optoelectronics , physics
The self-reference technique is widely used to measure the carrier-envelope phase offset (CEO) of femtosecond laser pulses in the normal femtosecond laser frequency comb system. However, the instability of the frequency comb system is increased because the photonic crystal fiber is introduced into the system to broaden the spectrum of femtosecond laser pulses outside the cavity. In this paper, we presented another method to measure specifically the CEO for the broad spectrum Ti:sapphire oscillator with the pulse duration of 7fs, namely the difference frequency technique, with which we have obtained the beat frequency signal with a S/N ratio greater than 31dB. This provided a good precondition for the next generation of the femtosecond laser frequency comb system without the photonic crystal fiber.