
Enhanced ferroelectricity of Pb(Zr0.5Ti0.5)O3 film by the introduction of La0.3Sr0.7TiO3 template layer
Author(s) -
王秀章,
刘红日
Publication year - 2007
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.56.1735
Subject(s) - ferroelectricity , materials science , electrode , dielectric , coercivity , layer (electronics) , perovskite (structure) , composite material , optoelectronics , chemical engineering , condensed matter physics , chemistry , physics , engineering
LaNiO3(LNO) and LaNiO3/La0.3Sr0.7TiO3 (LNO/LSTO) bottom electrodes were prepared on Si(111) substrates by sol-gel process. Then Pb (Zr0.5Ti0.5)O3 (PZT) ferroelectric films were then deposited on the bottoms also by sol-gel process. XRD showed that both of the PZT films have perovskite structure. The one on LNO bottom adopts (100) preferred orientation and the one on LNO/LSTO bottom adopts random orientation. The results of ferroelectric measurement showed that the ferroelectricity of the PZT film on LNO/LSTO bottom electrode was substantially enhanced compare with the one on LNO bottom electrode. The coercive field was also enhanced. The film on LNO/LSTO bottom electrode has larger dielectric constant and leakage current.