Open AccessElectron emission induced by the interaction of highly charged ions 207Pbq+(24≤q≤36) with solid surface of Si(110)
Author(s) -
Yuyu Wang,
Yongtao Zhao,
Guoqing Xiao,
Fang Yan,
Xiaoan Zhang,
Tieshan Wang,
Shiwei Wang,
Haibo Peng
Publication year - 2006
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.673
Subject(s) - projectile , ion , atomic physics , electron , electron capture , yield (engineering) , highly charged ion , physics , materials science , nuclear physics , ion source , quantum mechanics , thermodynamics
The electron emission induced by highly charged ions 207Pbq+(24≤q≤36) interacting with Si(110) surface is reported. The result shows that the electron emission yield Y has a strong dependence on the projectile charge state q, incidence angle ψ and impact energy E. In fitting the experimental data we found a nearly 1/tanψ dependence of Y. Theoretical analysis shows that these processes are closely related to the process of potential electron emission based on the classical over_the_barrier model.