Open AccessEnergy calculation of the stacking fault in fcc metals by embedded-atom method
Author(s) -
Jian-Min Zhang,
Xingda Wu,
Yühong Huang,
Kun Xu
Publication year - 2006
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.393
Subject(s) - stacking , materials science , stacking fault energy , stacking fault , atom (system on chip) , atomic physics , metallurgy , physics , alloy , nuclear magnetic resonance , computer science , embedded system
The stacking fault energies of fcc metals have been calculated by the embedded-atom method for 10 fcc metals, Cu, Ag, Au, Ni, Al, Rh, Ir, Pd, Pt and Pb. The calculated values are in good agreement with experimental results, that of Rh and Ir excepted.