
Research on photoionization of Ar·NO cluster using synchrotron radiation
Author(s) -
Sisheng Wang,
Ruihong Kong,
Tian Zhen-Yu,
Xu Shan,
Yunwu Zhang,
Liusi Sheng,
Zhenya Wang,
Liqing Hao,
Shuwen Zhou
Publication year - 2006
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.3433
Subject(s) - photoionization , synchrotron radiation , atomic physics , ionization , spectroscopy , cluster (spacecraft) , molecule , synchrotron , atom (system on chip) , photoionization mode , excitation , resonance (particle physics) , materials science , physics , ion , optics , programming language , quantum mechanics , computer science , embedded system
A supersonic beam of NO molecules mixed with Ar atoms was ionized by VUV synchrotron radiation from Hefei Light Source(HLS) at National Synchrotron Radiation Laboratory (NSRL). Photoionization efficiency spectroscopy (PIES) measurement was made for NO, Ar and heterogeneous clusters Ar·NO. In PIES spectum of Ar·NO, a strong resonance peak at the position of atomic rare gas resonance lines (11.5—12.0 eV) was observed, and it is shown that the excitation energy of the rare gas atom is transferred to the attached NO molecule within a heterogeneous cluster, leading to ionization of the molecule NO.