Open AccessSimulation of effect of atomic process on poloidal CXRS measurement
Author(s) -
Ting Zhang,
Ding Bojiang
Publication year - 2006
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.1534
Subject(s) - diamagnetism , atomic physics , ion , physics , charge exchange , spectroscopy , measure (data warehouse) , excited state , plasma , magnetic field , process (computing) , nuclear physics , computer science , quantum mechanics , database , operating system
With consideration of the effects of atomic process, a simple code modeling the correction to poloidal charge-exchange recombination spectroscopy (CXRS) measure ment is developed. The simulation results show that the measured poloidal veloci ty shift is overestimated in the ion diamagnetic drift direction and the apparen t ion temperature is underestimated because of the effects of energy-dependent e mission rate and finite lifetime of excited ions. This deviation will be more ob vious with the increase of temperature or magnetic field. The contributions from gradients of density and temperature are negligible compared to that from the a tomic process.