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Colossal magnetoresistance effect in the perovskite-type La1-xPrxMnO3 thin films
Author(s) -
Ping Duan,
Zhenghao Chen,
Dai Shou-Yu,
Zhou Yue-Liang,
Lü Hui-Bin
Publication year - 2006
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.1441
Subject(s) - colossal magnetoresistance , magnetoresistance , materials science , thin film , epitaxy , pulsed laser deposition , perovskite (structure) , giant magnetoresistance , substrate (aquarium) , condensed matter physics , x ray photoelectron spectroscopy , oxide , magnetic field , nuclear magnetic resonance , nanotechnology , crystallography , physics , chemistry , metallurgy , quantum mechanics , oceanography , layer (electronics) , geology
The oxide La1-xPrxMnO3 (x=0.1, 0.2) thin film s howing colossal magnetoresistance has been epitaxially grown on (100) SrTiO 3 single-crystal substrate by pulsed-laser deposition. The films have a pe rovskite structure and perform the colossal magnetoresistance effect with the ma ximum magnetoresistance ratio of 95% under the magnetic field of 5 T. The valenc e of Pr is confirmed as +4 through XPS. Therefore the epitaxial film is most lik ely an electron-doped colossal magnetoresistance fihn.

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