Open AccessNew computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines
Author(s) -
Qingqi Pei,
Yuwan Lou,
Yang Chen,
Xia Bao-Jia
Publication year - 2006
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.1325
Subject(s) - crystallite , stacking , hexagonal crystal system , materials science , diffraction , cubic crystal system , square (algebra) , stacking fault , condensed matter physics , crystallography , x ray , x ray crystallography , optics , geometry , nuclear magnetic resonance , physics , chemistry , mathematics , metallurgy
The least square method and corresponding computing programs for separating twofold broadening effects due to the crystallite-microstress, crystallite-stacking faults, microstress-stacking faults and three-fold effect of crystallite-stress-faults have been proposed and established. The least square method can be applied to closed packing hexagonal (cph), face-centered cubic (fcc) and body-centered cubic (bcc) structures. A few examples are presented and discussed.