Open AccessDetermination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer
Author(s) -
Mu Quanquan,
Yongjun Liu,
Lifa Hu,
Dayu Li,
Cao Zhaoliang,
Xuan Li
Publication year - 2006
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.55.1055
Subject(s) - ellipsometry , materials science , refractive index , liquid crystal , anisotropy , optics , crystal (programming language) , uniaxial crystal , phase (matter) , isotropy , layer (electronics) , thin film , optical axis , optoelectronics , chemistry , physics , nanotechnology , organic chemistry , lens (geology) , computer science , programming language
Spectroscopic ellipsometry is widely used in measuring the refractive index and thickness of optical isotropic thin layers. A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced. A UVISEL spectroscopic phase modulated ellipsometer is used to measure the ordinary refractive index, extraordinary refractive index and thickness of the liquid crystal layer in a parallel-aligned liquid crystal cell. The phase retardation Δnd is measured in transmission mode. The results show that the spectroscopic ellipsometry can be used to measure the anisotropic multilayer liquid crystal cell with high precision.