Open AccessFabrication of CNx nanotubes films using different nitrogen sources and their low field emission properties
Author(s) -
Pei Ding,
Mingju Chao,
Erjun Liang,
Xiaoqin Guo
Publication year - 2005
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.54.5926
Subject(s) - materials science , field electron emission , raman spectroscopy , crystallinity , transmission electron microscopy , carbon nanotube , silicon , nanotechnology , scanning electron microscope , nitrogen , chemical engineering , thermal decomposition , analytical chemistry (journal) , composite material , optoelectronics , electron , optics , chemistry , physics , organic chemistry , engineering , quantum mechanics , chromatography
The CNx nanotube films have been fabricated on Si substrates by thermal decomposition when NH4Cl and C2H8N2 were used as nitrogen sources. The scanning electron microscopy, transmission electron microscopy and Raman spectroscopy were used to characterize the CNx nanotubes. It is found that not only the degrees of purity and ordering, but also the morphology of the CNx nanotubes are quite different when different nitrogen sources are used. The CNx nanotubes fabricated by pyrolyzing C2H8N2/C10H10Fe have “bamboo-like” structure and lower crystallinity,and grow horizontally in good order on silicon substrates. Low field emission measurement gives a turn-on field of 1.0V/μm and 860μA/cm2 current density at 2.89V/μm.