Open AccessA new method for directly measuring frequency and intensity temporal profiles of attosecond XUV pulse simultaneously and completely
Author(s) -
Ge Yu-Cheng
Publication year - 2005
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.54.2653
Subject(s) - attosecond , laser , optics , extreme ultraviolet , femtosecond , physics , oscillation (cell signaling) , temporal resolution , polarization (electrochemistry) , ultrashort pulse , chemistry , biology , genetics
A new method of phase determination is presented to measure the frequency and intensity temporal profiles of attosecond XUV pulses directly, simultaneously and completely. Using a cross correlation between femtosecond laser and attosecond X UV, such profiles can be reconstructed from photoelectron energy spectra measure d with two different laser intensities at 0° and 180° with respect to the line ar laser polarization. The method has a temporal measurement range from a quarte r to about half of laser oscillation period. The temporal resolution depends on the jitter and control precision of the laser and XUV pulses. The method can be used for ultra_fast measurement on attosecond time scale.