Open AccessMeasurements of carrier-envelope-offset in the femtosecond Ti:sapphire laser
Author(s) -
Hainian Han,
Zhiyi Wei,
Jun Zhang,
Yuxin Nie
Publication year - 2005
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.54.155
Subject(s) - femtosecond , sapphire , materials science , offset (computer science) , laser , ti:sapphire laser , optoelectronics , optics , physics , computer science , programming language
It has been an increasing interest in the measurement and control of the carrier-envelope-phase offset (CEO) of femtosecond laser, which leads to an unprecedented progress in both fields of ultrafast laser techniques and frequency metrology. Based on the supercontinuum with a bandwidth of exceeding one octave, we measured and optimized the beat frequency signal by the self-reference technique. A frequency offset of 23 MHz was observed for the Ti:sapphire laser with a power of 500mW and pulse width of 18fs; it corresponds to the CEO of 053π. This work is a significant step toward coherent control of the femtosecond laser.