Study on the microstructure and properties of (Ti, Al)N film deposited by pulsed high energy density plasma | Zendy

Liu Yuan-Fu | Zendy; Han Jian-min | Zendy; Guling Zhang | Zendy; Jiuli Wang | Zendy; Guangliang Chen | Zendy; Xueming Li | Zendy; Wenran Feng | Zendy; Songhua Fan | Zendy; Chizi Liu | Zendy; Size Yang | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Study on the microstructure and properties of (Ti, Al)N film deposited by pulsed high energy density plasma

Author(s) -

Liu Yuan-Fu,

Han Jian-min,

Guling Zhang,

Jiuli Wang,

Guangliang Chen,

Xueming Li,

Wenran Feng,

Songhua Fan,

Chizi Liu,

Size Yang

Publication year - 2005

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.54.1301

Subject(s) - materials science , microstructure , nanoindentation , corrosion , x ray photoelectron spectroscopy , plasma , substrate (aquarium) , polarization (electrochemistry) , metallurgy , thin film , composite material , chemical engineering , nanotechnology , physics , oceanography , chemistry , quantum mechanics , engineering , geology

Hard and corrosion resistance (Ti, Al)N film was deposited by pulsed high energy density plasma on the substrate of 045% C carbon steel at ambient temperature. The microstructure of the film has been investigated by SEM,XRD,XPS and AES. The nanohardness of the film was tested by nanoindentation tester. The corrosion resistance of the film was tested by potentiodynamic polarization in 05 mol /L H2SO4 aqueous solution. The results indicate that the film mainly composed of (Ti, Al)N and a small amount of AlN. The nanohardness of the film approaches 26 GPa. The corrosion resistance of the film is improved by about one order of magnitude, compared with 1Cr18Ni9Ti austenitic stainless steel.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research