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A study on the in-situ growth of highly oriented ZnO whisker
Author(s) -
Yuan Hong-Tao,
Yao Zhang,
Gu Jing-Hua
Publication year - 2004
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.53.646
Subject(s) - whisker , whiskers , materials science , wurtzite crystal structure , chemical vapor deposition , metalorganic vapour phase epitaxy , scanning electron microscope , crystal (programming language) , in situ , monocrystalline whisker , radius of curvature , curvature , nanotechnology , chemical engineering , composite material , zinc , epitaxy , metallurgy , chemistry , organic chemistry , engineering , mean curvature , geometry , layer (electronics) , mean curvature flow , mathematics , computer science , programming language
Highly oriented ZnO whiskers were prepared on glass substrates by metal-organic chemical vapor deposition (MOCVD) at atmospheric pressure. X-ray diffraction result reveals that ZnO whiskers grow along 0001 direction and the crystal structure of ZnO is of wurtzite type. Scanning electron microscopic observations show that the length and shape of the whiskers are almost uniform. The diameters range from 100 to 800nm ,and the curvature radius of the whisker tip is about 50nm or even less. The chemical reaction process during the preparation of whiskers is discussed and a simple growth model of ZnO whisker deposited by MOCVD is proposed.

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