Open AccessPrediction of failure time for floating gate ROM devices at low dose rate in space radiation environment
Author(s) -
Bin He,
Hao Guo,
Gong Jiancheng,
Guizhen Wang,
Luo Yin-Hong,
Yonghong Li
Publication year - 2004
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.53.3125
Subject(s) - extrapolation , failure rate , dose rate , ionizing radiation , radiation , function (biology) , computer science , materials science , irradiation , physics , medical physics , reliability engineering , optics , mathematics , nuclear physics , statistics , engineering , evolutionary biology , biology
The experiments of ionizing radiation were performed on floating gate ROM device s by using 60Coγrays. The experimental aim was to examine the radi ation response at various dose rates. According to the extrapolation technique and the failu re criteria we defined,the parameter failure and function failure of devices vs. dose rate were studied. Finally, based on the function of failure timevs. doserate, the failure time of floating gate ROM device in space radiation environm ent was predicted.