Open AccessThe theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy
Author(s) -
Liu Xue-Rong,
Bo Hu,
Wenhan Liu,
Gao Chen
Publication year - 2003
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.52.34
Subject(s) - dielectric , materials science , microwave , nonlinear system , calibration , optics , field (mathematics) , condensed matter physics , physics , optoelectronics , mathematics , quantum mechanics , pure mathematics
In this paper,the interactions between the tip of the scanning tip microwave near-field microscopy and the nonlinear dielectric material were analyzed.The theoretical calibration coefficient in the measurement of nonlinear dielectric constant as a function of dielectric constant was obtained.The contributions to the coefficient from different directions and the resolution limit were also discussed.