The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy | Zendy

Liu Xue-Rong | Zendy; Bo Hu | Zendy; Wenhan Liu | Zendy; Gao Chen | Zendy

Open Access

The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy

Author(s) -

Liu Xue-Rong,

Bo Hu,

Wenhan Liu,

Gao Chen

Publication year - 2003

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.52.34

Subject(s) - dielectric , materials science , microwave , nonlinear system , calibration , optics , field (mathematics) , condensed matter physics , physics , optoelectronics , mathematics , quantum mechanics , pure mathematics

In this paper,the interactions between the tip of the scanning tip microwave near-field microscopy and the nonlinear dielectric material were analyzed.The theoretical calibration coefficient in the measurement of nonlinear dielectric constant as a function of dielectric constant was obtained.The contributions to the coefficient from different directions and the resolution limit were also discussed.

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