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The kinetics simulation of trap depths and capture cross sections of SETs in AgC l microcrystals doped with [Fe(CN)6]4- complex
Author(s) -
Shaopeng Yang,
Guangsheng Fu,
Xiaowei Li,
Ansong Geng,
Li Han
Publication year - 2003
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.52.2649
Subject(s) - doping , kinetics , photoconductivity , x ray photoelectron spectroscopy , materials science , microwave , transient (computer programming) , electron , atomic physics , analytical chemistry (journal) , physics , chemistry , optoelectronics , nuclear magnetic resonance , computer science , quantum mechanics , chromatography , operating system
To describe the photoelectron rise and decay process of AgCl microcrystals doped with Fe(CN)64-, a kinetics model composed of three in trinsic centres and a shallow electron traps(SETs)is set up, and further more, a set of differential equations is deduced. By solving the differential equations, photoelectron decay curve and photoelectron lifetime that is in accord with the transient microwave photoconductivity experimental data are obtained. Adjusting related simulation parameters, the SET depths and capture cross sections at room temperature for Fe(CN)64- are obtained and they are 0.115eV and 2 .136×10-17cm2, respectively.