Open Access薄栅氧化层中陷阱电荷密度的测量方法
Author(s) -
Hongxia Liu,
Zheng Xue-feng,
Hao Yao
Publication year - 2002
Publication title -
acta physica sinica
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.51.163
Subject(s) - computer science
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