Open AccessRAMAN SCATTERING FROM InAs NANOCRYSTALS EMBEDDED IN SiO2 THIN FILMS
Author(s) -
Zhu Kaigui,
Shi Jian-zhong,
Shao Qing-Yi
Publication year - 2000
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.49.2304
Subject(s) - materials science , nanocrystal , raman scattering , raman spectroscopy , phonon , scattering , thin film , crystal (programming language) , x ray raman scattering , nanotechnology , optics , condensed matter physics , physics , computer science , programming language
Raman scattering from InAs nanocrystals embedded in SiO2 thin films has been measured and studied. Raman spectra of InAs nanocrystals have a similar feature with that of bulk InAs crystal. Broadened and red-shifted Raman scattering peaks were observed from the nanocrystals; this has been attributed to the phonon confinement effect. A compressive stress in the interface between InAs nanocrystals and the SiO2 matrix was also taken into account to interpret the red shift.