STUDY ON SEMICONDUCTING YBCO THIN FILM AND CHARACTERISTICS OF BOLOMETER
Author(s) -
Jinghe Liu,
SUN QIANG,
Liu Xiang-dong,
XING HONG-YAN,
Jianli Li,
LI Guo-zhen,
Huang Zongtan,
Huang Cheng-cai,
Dan Li,
Jiangping Huang
Publication year - 2000
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.49.2017
Subject(s) - bolometer , materials science , thin film , raman spectroscopy , substrate (aquarium) , infrared , microstructure , optoelectronics , figure of merit , optics , nanotechnology , composite material , physics , detector , oceanography , geology
We have studied the semiconducting property of the Y1Ba2Cu 3O7-δ(δ≥05, abbreviated YBCO) thin film which is depo sited on Si substrate and the characteristics of the bolometer using the film to detect IR radiation. We measured TCR merit and Hall coefficient and analyzed th e microstructure and the responsive characteristics of the YBCO semiconducting t hin film through XRD and Raman spectrum. We believe that the thin film is a new sensing material which can be applied to uncooled infrared focal plane bolometers.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom