
The Magnetic and Magneto-Optic Properties of the Amorphous TbCo/Si Multilayers
Author(s) -
Xi Chen,
Yinjun Wang,
Liang Bing-Qing,
Jing Wang,
Jian Li
Publication year - 1999
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.48.224
Subject(s) - materials science , amorphous solid , kerr effect , condensed matter physics , magnetic anisotropy , magnetization , sputter deposition , anisotropy , saturation (graph theory) , diffraction , sputtering , nuclear magnetic resonance , thin film , optics , magnetic field , crystallography , nanotechnology , physics , nonlinear system , chemistry , mathematics , quantum mechanics , combinatorics
The Tb0.17Co0.83/Si multilayers prepared by a rf magnetron sputtering system with different Si thickness have been investigated. X-ray diffraction, magnetic measurement and Kerr rotation have been performed. With increasing thickness of Si layer tSi, the perpendicular anisotropy constant Ku decreased rapidly. The saturation magnetization Ms and the Kerr rotation θK decreased linearly when tSi increased. It was assumed that Co2Si and Tb had been formed in the interfacial zone between TbCo and Si layers. The reduction of Ku, Ms and θK is attributed to the decrease of the effective thickness of magnetic layer, which is linear with tSi.