Open AccessANALYSIS ON ENERGY ABSORPTION EDGE AND ELECTRON POPULATIONS OF Al
Author(s) -
Tian Shu-Fen,
Fan Xi-Jun,
Yu Luo-Ping,
J.S. Bow,
R. W. Carpenter,
Su Lin
Publication year - 1999
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.48.140
Subject(s) - atomic physics , excited state , ionization , atom (system on chip) , valence electron , electron , absorption edge , ionization energy , physics , l shell , valence (chemistry) , shell (structure) , electron shell , absorption (acoustics) , materials science , band gap , condensed matter physics , ion , nuclear physics , optics , quantum mechanics , earth's magnetic field , computer science , magnetic field , composite material , embedded system
A theoretical explanation for L core-shell absorption edge of electron energy loss spectrum of Al, an analysis of the electronic populations and a comparison between different partial cross sections are given. The edge was first normalized to the same atomic ionization cross section (per atom per electronvolt). The contributions for the cross section come from three respects:the first one is the electronic transitions from the core-shell to valence-shell calculated by extended Hückel band model, the second one is the final ionization state obtained by electron gas model, the third comes from the elastic backscatting of outgoing waves by the atoms that neighbor the excited atom. The agreement between the calculation result and the experimental result is good.