RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTOR | Zendy

Zhangcheng Xu | Zendy; GUO CHANG-LIN | Zendy; ZongYan Zhao | Zendy; Jiayue Xu | Zendy; Zhou Shengming | Zendy; Qi Ze-Ming | Zendy; T. Fukamachi | Zendy; Riichirou Negishi | Zendy; Takeshi Nakajima | Zendy

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RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTOR

Author(s) -

Zhangcheng Xu,

GUO CHANG-LIN,

ZongYan Zhao,

Jiayue Xu,

Zhou Shengming,

Qi Ze-Ming,

T. Fukamachi,

Riichirou Negishi,

Takeshi Nakajima

Publication year - 1998

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.47.1520

Subject(s) - diffraction , atom (system on chip) , crystal (programming language) , materials science , structure factor , absorption (acoustics) , enhanced data rates for gsm evolution , atomic physics , physics , computational physics , crystallography , condensed matter physics , optics , chemistry , computer science , telecommunications , programming language , embedded system

A new method for determining the separate temperature factors (STF) for different atoms in two-atom compound crystals is put forward. Using the characteristics of resonant X-ray dynamical diffraction by perfect crystals near the atomic absorption edge,two equations of STF are derived. As the parameters in the equations can be obtained from experimental measurement and theoretical calculation, STF can be determined by solving the equations. We applied this method to a perfect crystal GaAs at 300K, and obtained BGa=0.4573×10-20m2,BAs=0.7339×10-20m2. This method may be extended to the cases of multi-atom compound crystals.

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