Open AccessRESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTOR
Author(s) -
Zhimeng Xu,
Chucai Guo,
Zhibing Zhao,
Xu Jia-Yue,
Shengming Zhou,
Zeming Qi,
T. Fukamachi,
R. Negishi,
Tetsuo Nakajima
Publication year - 1998
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.47.1520
Subject(s) - diffraction , atom (system on chip) , crystal (programming language) , materials science , structure factor , absorption (acoustics) , enhanced data rates for gsm evolution , atomic physics , physics , computational physics , crystallography , condensed matter physics , optics , chemistry , computer science , telecommunications , programming language , embedded system
A new method for determining the separate temperature factors (STF) for different atoms in two-atom compound crystals is put forward. Using the characteristics of resonant X-ray dynamical diffraction by perfect crystals near the atomic absorption edge,two equations of STF are derived. As the parameters in the equations can be obtained from experimental measurement and theoretical calculation, STF can be determined by solving the equations. We applied this method to a perfect crystal GaAs at 300K, and obtained BGa=0.4573×10-20m2,BAs=0.7339×10-20m2. This method may be extended to the cases of multi-atom compound crystals.