X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES | Zendy

Liu Hongchao | Zendy; GUO CHANG-LIN | Zendy

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X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES

Author(s) -

Liu Hongchao,

GUO CHANG-LIN

Publication year - 1997

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.46.524

Subject(s) - rietveld refinement , materials science , powder diffraction , diffraction , phase (matter) , crystallography , distribution (mathematics) , x ray crystallography , x ray , optics , physics , mathematical analysis , mathematics , chemistry , quantum mechanics

It is very difficult to obtain SiC polytypes distribution by normal X-ray powder diffraction quantitative phase analysis methods. The whole pattern fitting Rietveld method is introduced to address this problem. The principle and advantages of Rietveld method in determining SiC polytypes distribution are described. The final results show that the distribution of the most common four SiC polytypes, 6H, 4H, 3C and 15R, can be given accurately. The detection limits of each polytypes are also estimated based on their standard deviations

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