Open AccessX-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES
Author(s) -
Hongchao Liu,
Chucai Guo
Publication year - 1997
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.46.524
Subject(s) - rietveld refinement , materials science , powder diffraction , diffraction , phase (matter) , crystallography , distribution (mathematics) , x ray crystallography , x ray , optics , physics , mathematical analysis , mathematics , chemistry , quantum mechanics
It is very difficult to obtain SiC polytypes distribution by normal X-ray powder diffraction quantitative phase analysis methods. The whole pattern fitting Rietveld method is introduced to address this problem. The principle and advantages of Rietveld method in determining SiC polytypes distribution are described. The final results show that the distribution of the most common four SiC polytypes, 6H, 4H, 3C and 15R, can be given accurately. The detection limits of each polytypes are also estimated based on their standard deviations