Open AccessDIELECTRONIC RECOMBINATION AS TWO INDEPENDENT PROCESSES
Author(s) -
Jianguo Wang,
Zou Yu,
Chang Tie-Qiang
Publication year - 1997
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.46.2146
Subject(s) - physics , auger effect , auger , atomic physics , recombination , spontaneous emission , radiative transfer , inverse , atom (system on chip) , quantum , plasma , process (computing) , quantum mechanics , computer science , laser , biochemistry , chemistry , geometry , mathematics , gene , embedded system , operating system
In this paper,dielectronic recombination process is proposed as two independent processes resonant capture(inverse Auger) process and radiative decay process,which can be used- conveniently in the varied plasmas environments.Through the quantum defect theory,a simplified- analytical formula is introduced to calculate the Auger rate and the theoretical results have been- compared with a simplified relativistical configuration interaction calculation.Finally,a method for- applying the formula to the average atom model is given.