Open AccessSTUDY ON ULTRA THIN AlGaAs LAYER ON GaAs
Author(s) -
Xingquan Liu,
Wei Lü,
Mu Yao-Ming,
Qiao Yi-Min,
Xiaoshuang Chen,
Ming-Fang Wan,
Zha Fang-Xing,
Liping Yan,
Xuechu Shen
Publication year - 1997
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.46.1613
Subject(s) - materials science , substrate (aquarium) , layer (electronics) , thin film , sample (material) , optoelectronics , analytical chemistry (journal) , optics , composite material , chemistry , nanotechnology , physics , oceanography , chromatography , geology
A Series of samples of ultra thin AlGaAs films grown on GaAs(100) substrate by MBE are studied by photomodulated reflectance (PR)spectroscopy in ultra high vacuum chamber.More than one peak are observed for samples with thickness less than 35nm,but only one peak is observed for 100nm thick sample,The position and width of these peaks change with sample thickness.The experimental results are well explained by step potential model.