Open AccessCHARACTERIZATION OF Hg1-xCdxTe EPITAXIAL FILMS ON VARIOUS VICINAL PLANES
Author(s) -
Biao Li,
Chu Jun-Hao,
Zhu Ji-qian,
Xinqiang Chen,
Cao Ju-Ying,
Dewei Tang
Publication year - 1997
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.46.1168
Subject(s) - vicinal , epitaxy , materials science , facet (psychology) , raman spectroscopy , raman scattering , cadmium telluride photovoltaics , diffraction , substrate (aquarium) , crystal growth , optics , crystallography , x ray crystallography , optoelectronics , nanotechnology , chemistry , psychology , social psychology , physics , oceanography , organic chemistry , personality , layer (electronics) , geology , big five personality traits
The Hg1-xCdxTe films were prepared by a dipping liquid phase epitaxy technique on spherical CdTe substrate with several different misoriented facets. They were characterized by means of micrograph,infrared absorption spectra, Raman scattering, and X ray double crystal diffraction. The results show that-near facet (δ<1°) and terrace free (δ≈1.2 °) growth modes are superior in both the planarity and the amount of precipitates.