EXCITONIC OPTICAL NONLINEARITIES FOR ZnSe THIN FILM
Author(s) -
Xiqing Zhang,
Fan Xi-wu,
Yimin Chen,
Lü You-Ming,
Zhuhong Zheng
Publication year - 1997
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.46.1118
Subject(s) - materials science , refractive index , optics , attenuation coefficient , thin film , sign (mathematics) , wavelength , nonlinear system , intensity (physics) , laser , spectral line , absorption (acoustics) , optoelectronics , molecular physics , physics , quantum mechanics , nanotechnology , mathematical analysis , mathematics
We present a simple,but highly sensitive,method for obtaining both the sign and magnitude of the nonlinear refractive index and the nonlinear absorption coefficient as a function of wavelength. It is shown theoretically that these paramters can be easily obtained from the linear and nonlinear thansmission spectra of the medium as well as the laser intensity distribution on the frequancy. This technique is demonstrated for ZnSe thin film at 77K and room temperature.
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