
TRANSIENT DECAY OF PHOTOEXCITED CARRIERS AND PHOTOLUMINESCENCE EFFICIENCY IN QUANTUM WELLS
Author(s) -
Jin Shi-Rong,
Aizhen Li,
Chu Jun-Hao,
Shiwei Chen
Publication year - 1997
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.46.1001
Subject(s) - photoluminescence , quantum well , recombination , excitation , transient (computer programming) , materials science , carrier lifetime , free carrier , quality (philosophy) , doping , atomic physics , physics , condensed matter physics , optoelectronics , optics , chemistry , silicon , quantum mechanics , laser , biochemistry , computer science , gene , operating system
We present a phenomenological model for the recombination of photoexcited carriers in quantum wells,which takes into account of the nonradiative recombination and the screening effect of free carriers in the wells.The results show,that the decay time of photoluminescence is strongly related to the sample quality,doping level,as well as the excitation intensity.