Open AccessMEASUREMENT OF NONLINEAR REFRACTIVE INDEX WITH Z-SCAN METHOD FOR SLOW DECAY MATERIALS
Author(s) -
Qiguang Yang,
Haosheng Fei,
Wei Zhenqian
Publication year - 1995
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.44.1754
Subject(s) - z scan technique , nonlinear system , refractive index , optics , electric field , signal (programming language) , physics , field (mathematics) , nonlinear optics , computational physics , materials science , quantum mechanics , computer science , mathematics , programming language , pure mathematics
The measurement of nonlinear refractive index with Z-scan method for slow decay materials are discussed in detail. We derive the resultant electric field pattern at the aperture. It is pointed out that the accumulating effect contribute largely to the Z-scan signal in the slow decay nonlinear optical materials. The theoretical analysis is consistent with experimental result.