MEASUREMENT OF NONLINEAR REFRACTIVE INDEX WITH Z-SCAN METHOD FOR SLOW DECAY MATERIALS | Zendy

Yang Qi-guang | Zendy; Haosheng Fei | Zendy; Zhenqian Wei | Zendy

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MEASUREMENT OF NONLINEAR REFRACTIVE INDEX WITH Z-SCAN METHOD FOR SLOW DECAY MATERIALS

Author(s) -

Yang Qi-guang,

Haosheng Fei,

Zhenqian Wei

Publication year - 1995

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.44.1754

Subject(s) - z scan technique , nonlinear system , refractive index , optics , electric field , signal (programming language) , physics , field (mathematics) , nonlinear optics , computational physics , materials science , quantum mechanics , computer science , mathematics , programming language , pure mathematics

The measurement of nonlinear refractive index with Z-scan method for slow decay materials are discussed in detail. We derive the resultant electric field pattern at the aperture. It is pointed out that the accumulating effect contribute largely to the Z-scan signal in the slow decay nonlinear optical materials. The theoretical analysis is consistent with experimental result.

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